Annealing of MOS Capacitors with Implications for Test Procedures to Determine Radiation Hardness
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 1981
ISSN: 0018-9499
DOI: 10.1109/tns.1981.4335680